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(a) Schematic view and (b) photograph of a stack.
characteristics of a self-planarized stack (Sample No. 1) at 25, 40, 60, and .
Temperature dependences of the critical currents , , and return currents for four stacks with slightly different critical currents. The solid lines are the AB relation, and dotted lines show the calculated results with Zappe theory. In fitting the data, we use the parameters as listed in Table I.
Temperature dependence of the normalized -axis resistance of the stack (No. 4). The solid line is the Heine relation.
Junction parameters estimated using a four-terminal measurement technique.
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