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(a) Scanning electron microscope (SEM) images of a coated-conductor fiber. (b) A cross-section image of the coated-conductor fiber. (c) A blown-up SEM image of the surface, showing elongated crystallites with random orientations.
Integrated x-ray diffraction scan of a pure coated-conductor fiber collected using a two-dimensional area detector.
Voltage-magnetic field curves for (a) a pure fiber, (b) carbon-alloyed fibers 1, and (c) carbon-alloyed fibers 2. For each set of data, the lowest and the highest temperatures of the measurements are shown.
Temperature dependencies of (a) and (b) for the three coated-conductor fibers shown in Fig. 3 .
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