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Schematic illustration of the scanned-energy photoelectron-yield ultrasoft x-ray SW measurement for an organic monolayer formed on a SW generator (periodic multilayer).
Polarization dependence of carbon -edge NEXAFS spectra taken for the 8Az6–Cd monolayer formed on the SW generator.
Scanned-energy photoelectron-yield SW profile obtained from (a), (b), and (c) XPS peak intensities (sold circles). The x-ray incident angle was 15 ° from the surface parallel. The calculated SW profiles using the structural parameters listed in Table I are indicated by solid lines.
Structure model for the 8Az6-Cd monolayer formed on the multilayer.
Relative height from the scatter plane and coherent factor obtained from curve fitting analyses for the SW profiles of W, N, and Cd atoms in the sample.
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