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Determination of thickness and lattice distortion for the individual layer of strained superlattice by high-angle annular dark-field scanning transmission electron microscopy
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10.1063/1.1995952
/content/aip/journal/apl/87/3/10.1063/1.1995952
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/3/10.1063/1.1995952
/content/aip/journal/apl/87/3/10.1063/1.1995952
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/content/aip/journal/apl/87/3/10.1063/1.1995952
2005-07-14
2014-09-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Determination of thickness and lattice distortion for the individual layer of strained Al0.14Ga0.86N∕GaN superlattice by high-angle annular dark-field scanning transmission electron microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/3/10.1063/1.1995952
10.1063/1.1995952
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