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Dependence of in-plane coercivity on annealing temperature for 5, 9, and 50 nm FePt films with 10 nm AuCu underlayer (solid symbols) and without underlayer (hollow symbols).
Dependence of in-plane coercivity on FePt thickness after 350 and 400 °C annealing. The solid and hollow marks are for FePt films with 10 nm AuCu underlayer and without underlayer, respectively.
(a) Variation of coercivity of 9 nm FePt film as a function of AuCu underlayer thickness. In-plane hysteresis loops for (b) 9 nm FePt film on 10 nm AuCu, (c) 9 nm FePt films on 50 nm AuCu. Samples have been annealed at 350 °C (∎) and 400 °C (◻).
Conventional XRD spectra for (a) 9 nm FePt on 10 nm AuCu, and (b) 9 nm FePt on 50 nm AuCu, in the as deposited state and after annealing at different temperatures. The insets of (a) and (b) show the corresponding XRD patterns by tilting scan.
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