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True atomic resolution in liquid by frequency-modulation atomic force microscopy
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10.1063/1.1999856
/content/aip/journal/apl/87/3/10.1063/1.1999856
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/3/10.1063/1.1999856
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) The crystal structure of muscovite mica; (a) -axis projection; (b) cleaved surface ( ions are not shown).

Image of FIG. 2.
FIG. 2.

(Color online) FM-AFM image of the cleaved (001) surface of muscovite mica taken in water ( , , , scanning speed: ). The tip-sample distance regulation was made in constant frequency shift mode. The cantilever used was an -Si cantilever (Nanosensors: NCVH) with a spring constant of and a resonance frequency of 176 kHz in water. The factor measured in water was 23.

Image of FIG. 3.
FIG. 3.

(Color online) FM-AFM images of the cleaved (001) surface of muscovite mica taken in water. (a) , , , scanning speed: ; (b) , , , scanning speed: ; (c) , , , scanning speed: ; (d) , , , scanning speed: . The images were taken in constant height mode. The cantilever used was an -Si cantilever (Nanosensors: NCH) with a spring constant of and a resonance frequency of 136 kHz in water. The factor measured in water was 30.

Image of FIG. 4.
FIG. 4.

Frequency shift–distance curve measured on a cleaved (001) surface of muscovite mica in water ( , , , ). The curve was taken with a tip velocity of and approximately 1000 data points. The tip-sample contact point is not identified.

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/content/aip/journal/apl/87/3/10.1063/1.1999856
2005-07-12
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: True atomic resolution in liquid by frequency-modulation atomic force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/3/10.1063/1.1999856
10.1063/1.1999856
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