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The typical SEM and HRTEM images of the Si nanotip samples; (a)–(c) the nanotips with SiC apex; (d)–(f) the nanotips with apex; and (g)–(i) the pure Si nanotips.
The typical curves of the Si nanotips with different apexes; five curves for each type of nanotip samples are indicated. Corresponding F-N plots are shown in the inset.
The typical spatial distributions of emission site (in an area of ) of the Si nanotip samples of various apexes obtained under various electric fields: (a) the pure Si nanotips; (b) the Si nanotips with SiC apex; (c) the Si nanotips with apex.
The preparation conditions and the geometric parameters of the Si nanotips fabricated using the method developed in the present study as compared to the previously reported ones.
Comparison of the field enhancement factors , turn-on field , threshold field , , , and of the Si nanotips with different apexes.
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