Full text loading...
(Color online) (a) TEM micrograph and (b) selected area diffraction patterns of CCTO sintered at in air for . The diffraction patterns were obtained from the regions denoted by a circled number, as shown in (a). “T” in each SAED pattern indicates the transmitted spot of the electron beam.
(Color online) (a) TEM micrograph of CCTO sintered at in air for , showing quite a thick domain wall. The upper inset is the diffraction pattern of region A. The lower inset also shows the diffraction pattern of the domain wall region denoted by a broken circle. (b) Enlargement of the diffraction pattern indicated by a rectangle as shown in the lower inset of (a).
(Color online) (a) A  HREM image including a domain wall, and (b) the corresponding Fourier filtered image. The misfit dislocations are indicated by an arrow. (c) Schematic illustration of orientational geometry between the two domains.
(Color online) (a) Optical micrograph showing the surface of a polycrystalline CCTO specimen; (b) surface topographical image of the region indicated by a square in the optical micrograph with AFM; (c) schematic diagram for the applied external bias using a cantilever tip; and (d) surface potential image after the applied bias of , respectively.
Article metrics loading...