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Scanning electron microscopy (SEM) images of SOT tips: (a) a tip with all four sides etched to identical profile, which can be considered as a tip supported by four identical springs connected in parallel; (b) a different profile of a spring tip where the tip is effectively supported by one spring connected to the probe cantilever.
A SOT tip with springs on two sidewalls. Two of four sidewalls have been completely removed.
The spring system used to analyze the SOT probe.
ANSYS simulation result for a sidewall of a SOT tip. The thickness of the film is . The result shows a deflection under force applied at the tip.
(a) A LFM image of ODT lines generated by a SOT tip on a gold surface. The writing speeds for the lines are 0.1, 0.2, and the linewidths are 175, 120 and , respectively. (b) ODT linewidths generated by a SOT tip at different writing speeds.
ANSYS simulation results for SOT tip designs.
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