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Measuring the continuity of diffusion barriers on porous films using -ray energy spectra of escaping positronium
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10.1063/1.2007862
/content/aip/journal/apl/87/5/10.1063/1.2007862
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/5/10.1063/1.2007862
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Image of FIG. 1.
FIG. 1.

Positronium three-photon annihilation parameter as a function of positron implantation energy for four samples of porous layers deposited on Si substrates. (a) Uncapped MSQ; (b) 400 nm Nanoglass (NG), capped by 20 nm Ta; (c) same as (b) but capped by 40 nm Ta and then 100 nm Cu; (d) same as (c), but annealed at 300 °C for 1 h in Ar.

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/content/aip/journal/apl/87/5/10.1063/1.2007862
2005-07-28
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measuring the continuity of diffusion barriers on porous films using γ-ray energy spectra of escaping positronium
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/5/10.1063/1.2007862
10.1063/1.2007862
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