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Nb -edge EXAFS spectra from Nb-doped (5 at. %) Mg samples, compared to that one of the metallic Nb foil.
EXAFS analysis of the Nb-doped (5 at. %) Mg samples. (a) -weighted Fourier transform moduli (transformation range for the as-deposited sample, for the others) of the EXAFS spectra (markers) and corresponding best fit curves (solid line) of the first two coordination signals (Nb–Mg and Nb–Nb for the as-deposited sample, two Nb–Nb for the others); no backscatterer phase-shift correction was applied in the figure. (b) Fourier filtered spectrum (markers) in the fitting range and superimposed fit (solid line) of the as-deposited sample; the residuum and the two single-scattering signals that contribute to the fit are reported.
XRD spectra of (a) hydrogenated sample and (b) dehydrogenated sample. The inset in (a) shows the deconvolution of the Mg(101) and peaks: continuous line—experimental data, dashed line—fitting and dotted line—envelope of the fitted curves.
TEM micrograph of the dehydrogenated sample showing distribution and size of the metallic Nb nanoclusters.
Results of the Nb -edge EXAFS analysis on Nb-doped Mg films; for each pair of atoms, is the coordination number, the interatomic distance and the Debye–Waller factor; the uncertainty in the fitting results corresponds to a confidence level of 68%. Crystallographic data for metallic Nb and the simulation of the local structure around a Nb substitutional impurity into the Mg lattice are also reported.
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