No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Effect of damage by 2 MeV He ions and annealing on in thin films
5.V. Braccini, A. Gurevich, J. E. Giencke, M. C. Jewell, C. B. Eom, D. C. Larbalestier, A. Pogrebnyakov, Y. Cui, B. T. Liu, Y. F. Hu, J. M. Redwing, Q. Li, X. X. Xi, R. K. Singh, R. Gandikota, J. Kim, B. Wilkens, N. Newman, J. Rowell, B. Moeckly, V. Ferrando, C. Tarantini, D. Marre, M. Putti, C. Ferdeghini, R. Vaglio, and E. Haanappel, Phys. Rev. B 71, 012504 (2005).
7.R. Gandikota, R. K. Singh, J. Kim, B. Wilkens, N. Newman, J. M. Rowell, A. V. Pogrebnyakov, X. X. Xi, J. M. Redwing, S. Y. Xu, and Q. Li, Appl. Phys. Lett. 86, 012508 (2005).
8.X. Zeng, A. V. Pogrebnyakov, A. Kotcharov, J. E. Jones, X. X. Xi, E. M. Lysczek, J. M. Redwing, S. Xu, Q. Li, J. Lettieri, D. G. Scholm, W. Tian, X. Pan, and Z-K. Liu, Nat. Mater. 1, 35 (2002).
10.B. H. Moeckly and W. S. Ruby (unpublished).
11.It has been pointed out that the limited connectivity of many samples results in an increase in over the value seen in fully connected samples. The typical value of in a number of PSU and STI films is about ( for the film PB); hence, the connectivity factor used in this work is (measured), i.e., the intragrain resistivity or is .
14.M. Putti, V. Braccini, C. Ferdeghini, F. Gatti, P. Manfrinetti, D. Marre, A. Palenzona, I. Pallecchi, C. Tarantini, I. Sheikin, H. U. Aebersold, and E. Lehmann, Appl. Phys. Lett. 86, 112503 (2005).
17.J. M. Rowell and R. C. Dynes (unpublished).
Article metrics loading...
Full text loading...
Most read this month