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(a) Side view of experimental setup. The edge of the Au film is perpendicular to the axis. (b) Calculation of the tip-scattered amplitude signals predicts an interference pattern depending on the SP wavelength. Solid and dashed lines represent and .
The s-SNOM imaging of surface phonon polariton propagation excited by the edge of a 15-nm-thick Au film. (a) Topography. (b) Infrared amplitude images reveal interference fringes parallel to the edge. The image at was taken first by scanning region A. At the position marked by the dashed line the scan was continued but the wavelength was changed to (region B). The image at was obtained by repeated scanning of region A. The illumination direction is from left to right.
Calculated (solid) and measured (dots) surface phonon polariton dispersion on 4H–SiC. The dashed line represents the light line in vacuum.
Calculated (solid line) and measured (dots) surface phonon polariton propagation length on 4H–SiC.
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