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SEM image of SiGe whiskers (JEOL JSM5510S microscope).
(a) Scanning ion microscopy (SIM) image of a SiGe whisker obtained by using the FIB equipment. (b) HAADF-STEM images of cross sections of the whisker. Very dark contrast around the cross sections is due to Al because the whisker was coated with Al before cross-sectional microsampling.
Elemental mapping of the three cross sections by EDX.
Values of average atomic ratio of the core and the shell vs position from the tip of the whisker.
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