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Core-shell SiGe whiskers with composition gradient along the axial direction: Cross-sectional analysis
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10.1063/1.2034110
/content/aip/journal/apl/87/8/10.1063/1.2034110
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/8/10.1063/1.2034110
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

SEM image of SiGe whiskers (JEOL JSM5510S microscope).

Image of FIG. 2.
FIG. 2.

(a) Scanning ion microscopy (SIM) image of a SiGe whisker obtained by using the FIB equipment. (b) HAADF-STEM images of cross sections of the whisker. Very dark contrast around the cross sections is due to Al because the whisker was coated with Al before cross-sectional microsampling.

Image of FIG. 3.
FIG. 3.

Elemental mapping of the three cross sections by EDX.

Image of FIG. 4.
FIG. 4.

Values of average atomic ratio of the core and the shell vs position from the tip of the whisker.

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/content/aip/journal/apl/87/8/10.1063/1.2034110
2005-08-19
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Core-shell SiGe whiskers with composition gradient along the axial direction: Cross-sectional analysis
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/8/10.1063/1.2034110
10.1063/1.2034110
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