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Indirect electron-beam poling through a dielectric buffer layer.
(a) Microscope picture of the - side of the etched structure, the dark dots are the inverted domains. (b) An AFM scan of a lattice node, taken from a different sample with a hexagonal poling pattern and macrodomain diameter of . The brighter shade represents deeper topography. (c) Diffraction pattern of the lattice. The bright central spot is the zeroth-order diffraction of the beam.
Experimental setup for characterizing angle-dependent second-harmonic generation in rectangular-poled .
(a) The reciprocal lattice for the structure. It can be noticed that both the real and the reciprocal lattices are rotated in 7.5° relative to the zero angle of the fundamental. (b) Angular relation between the fundamental input angle and the second-harmonic output angle (relative to the fundamental), both in air. In both figures, experimental values are denoted by crosses, theoretical values by squares, and the numbers in parentheses are the and coefficient of the corresponding RLV.
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