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(a) Geometrical layout of the pump-probe beams measurement relative to the sample. The schematic of the composition of 1D PC with two defect layers is shown in the inset. The gray and white blocks represent and layers, and the dark blocks D1 and D2 represent CdS defect layers, respectively. (b) The measured (dotted line) and simulated (solid line) transmission spectrum of 1D PC with two defect layers. The simulated curve is calculated by transfer matrix method with fitting parameters: , , , and , the refractive indices are , , . The subscripts H, L, D1, and D2 represent , , CdS, and CdS, respectively.
(a) Transient transmission changes of probe beam for 1D PC with the incident wavelength of . The inset is pump intensity dependence of the transmission changes of probe beam at zero delay time for 1D PC. (b) Transient transmission changes of probe beam for 1D PC at defect modes of 762 (open square) and (solid square), respectively. The transient transmission changes of probe beam for a bulk ZnSe as a reference sample at 762 (open circle) and (solid circle) are given. The pump intensities are 0.9 and at 762 and , respectively.
Calculated electric field intensity distribution within 1D PC with incident wavelengths of 762 and . The incident electric field intensity is set to unity. The spare diagonal and white blocks represent and , and the gray blocks D1 and D2 represent CdS defect layers.
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