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Cross-sectional HAADF-STEM images of samples: (a) without annealing, and (b) with annealing. (c) Image intensity distribution along line in (a). Intensity of Si atomic dumbbell was smaller at interface (denoted by arrow).
Integrated intensity distribution in sample (a) without annealing and (b) with annealing. Solid circles represent measured intensities, and solid lines represent fitted Gaussian curves.
Values of and in Gaussian curves [Eq. (2)] fitted to measured intensity distribution.
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