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(Color online) (a) The surface morphology of a bicrystal substrate probed with AFM. (b) The schematic plot of multi-SQUID arrangement of the magnetometer.
The surface morphology of different junctions probed with SEM: (a) the good junction, (b) and (c) the mediocre junctions, and (d) the bad junction. The arrow indicates the location of grain boundary. (e) Formation of YBCO grains on the junction. (f) The depth of junction in (d) measured by AFM.
(Color online) The electrical properties of SQUID for mediocre junctions (a) annealed at , (b) without annealing; for bad junctions (c) annealed at (d) without annealing and (e) with semiconductor behavior.
(Color online) The low-frequency flux noise of SQUIDs labeled (a) and (b) are good junctions, and labeled (c) and (d) are mediocre junctions.
The electrical properties of SQUIDs with different junction widths and groove depths. All the properties are measured at .
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