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Electric field enhancement by a nanometer-scaled conical metal tip in the context of scattering-type near-field optical microscopy
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10.1063/1.2183362
/content/aip/journal/apl/88/10/10.1063/1.2183362
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/10/10.1063/1.2183362
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic view of the conical tip under consideration: is the tip length; is the cone angle; is the radius of curvature of the tip apex; and is the near-field observation point.

Image of FIG. 2.
FIG. 2.

The spectral dependence of the electric field enhancement factor at a distance from the cone apex for (a) 75 and (b) cone tips.

Image of FIG. 3.
FIG. 3.

Dependence of the electric field enhancement on the distance for three silver cone tips with cone angles 5°, 10°, and 45° at their corresponding resonant peak wavelengths. The solid lines represent the fit curves according to the equation .

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/content/aip/journal/apl/88/10/10.1063/1.2183362
2006-03-07
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electric field enhancement by a nanometer-scaled conical metal tip in the context of scattering-type near-field optical microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/10/10.1063/1.2183362
10.1063/1.2183362
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