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Electric field enhancement by a nanometer-scaled conical metal tip in the context of scattering-type near-field optical microscopy
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10.1063/1.2183362
/content/aip/journal/apl/88/10/10.1063/1.2183362
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/10/10.1063/1.2183362
/content/aip/journal/apl/88/10/10.1063/1.2183362
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/content/aip/journal/apl/88/10/10.1063/1.2183362
2006-03-07
2014-11-27
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electric field enhancement by a nanometer-scaled conical metal tip in the context of scattering-type near-field optical microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/10/10.1063/1.2183362
10.1063/1.2183362
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