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integral intensity as a function of ITO coverage.
XPS spectra of the reactive metal contacts: (a) the levels of the Cl-terminated monolayer, and (b) the levels of the -terminated monolayer, with deposited ITO and without ITO.
SEM images of the ITO films (thickness ) grown on: (a) Cl-terminated, (b) -terminated, and (c) -terminated monolayers.
(a) Typical current-voltage characteristics measured between the TLM pads with a spacing of and (b) plots of the measured total resistance versus the spacings (d) between the TLM pads.
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