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Layer-resolved study of magnetic interaction effects in heterostructure dot arrays
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10.1063/1.2179116
/content/aip/journal/apl/88/11/10.1063/1.2179116
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/11/10.1063/1.2179116
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) (a) SEM image of the dot array. (b) XRMS experimental setup. Circularly polarized (CP) x rays were used to probe the sample magnetization along the applied field . At specular condition , reflected intensities were measured as a function of angle , incident x-ray energy , and field .

Image of FIG. 2.
FIG. 2.

(Color online) Normalized XRMS signal as a function of applied field from single-layer arrays. The data points as the field was changed from to are represented as solid circles, and the points as the field was changed from to are represented as hollow circles. The film structures are shown as the insets. (a) Measured hysteresis loop from the NiFe dot array. (b) Measured hysteresis loop from the Co dot array.

Image of FIG. 3.
FIG. 3.

(Color online) Normalized XRMS signal as a function of applied field from dot array. The film structure is shown as the inset. (a) Measured hysteresis loop of the NiFe layer. (b) Measured hysteresis loop of the Co layer.

Image of FIG. 4.
FIG. 4.

(Color online) Normalized XRMS signal as a function of applied field from a dot array. The film structure is shown as the inset. (a) Measured hysteresis loop of the NiFe layer. (b) Measured hysteresis loop of the Co layer.

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/content/aip/journal/apl/88/11/10.1063/1.2179116
2006-03-14
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Layer-resolved study of magnetic interaction effects in heterostructure dot arrays
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/11/10.1063/1.2179116
10.1063/1.2179116
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