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(a) Linear regime transfer characteristics of a PQT-12 TFT under dry nitrogen (solid line) using continuous gate measurements, 45% RH in nitrogen (dots) using pulsed gate voltages, and using continuous application of the gate voltage (triangles). The source-drain voltage was . (b) Log-scale plot of transfer characteristic in (a) under dry nitrogen (line) and under 45% RH (triangles).
Linear regime field-effect mobility as a function of RH in nitrogen measured using pulsed gate voltages with the current measured after the beginning of the gate pulse.
(a) Current measurement at a fixed gate voltage with respect to time at . Solid—dry nitrogen; squares: 25% RH in nitrogen; dots: 65% RH in nitrogen. (b) Rate constant for bipolaron formation as a function of relative humidity in nitrogen.
(a) Mass uptake of water into a PQT-12 film on OTS-coated at varying humidity in nitrogen measured using a quartz crystal microbalance (the line is provided as a guide for the eyes and does not represent a fit to the data). (b) Mass uptake of water as a function of time at 30% RH in nitrogen for a film of PQT-12 on bare silicon dioxide.
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