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Electrical characterization of amorphous lanthanum aluminate thin films grown by molecular-beam deposition on silicon
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10.1063/1.2182019
/content/aip/journal/apl/88/11/10.1063/1.2182019
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/11/10.1063/1.2182019
/content/aip/journal/apl/88/11/10.1063/1.2182019
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/content/aip/journal/apl/88/11/10.1063/1.2182019
2006-03-16
2015-02-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electrical characterization of amorphous lanthanum aluminate thin films grown by molecular-beam deposition on silicon
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/11/10.1063/1.2182019
10.1063/1.2182019
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