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Characterization of ultrasmall all-Nb tunnel junctions with ion gun oxidized barriers
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View: Figures


Image of FIG. 1.
FIG. 1.

TEM image of the tunnel junction cross section with a Nb-oxide layer in the middle oxidized for .

Image of FIG. 2.
FIG. 2.

vs of the junctions with a barrier oxidized for 1, 3, 5, and . The inset represents a magnified plot in the high temperature region. The dashed lines are a fit to Eq. (4).

Image of FIG. 3.
FIG. 3.

(a) Examples of the measured (open circles) and fitted [Eqs. (5) and (1), solid lines] curves for the data of Fig. 2 in the high temperature region. The fitted parameters: and . (b) Values of the barrier thickness and height extracted from thermionic emission current fitting [Eqs. (5) and (1)] as a function of the oxidation time (open squares). For comparison, the values of the barrier thickness estimated from TEM images are also shown (solid squares).

Image of FIG. 4.
FIG. 4.

characteristics for an all-Nb SET at in the normal state at . Clear Coulomb diamond structures are observed near the origin.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of ultrasmall all-Nb tunnel junctions with ion gun oxidized barriers