1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Deep-ultraviolet photodiodes with low cutoff wavelength
Rent:
Rent this article for
USD
10.1063/1.2186974
/content/aip/journal/apl/88/12/10.1063/1.2186974
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/12/10.1063/1.2186974
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Spectral transmission measurement of the wafer.

Image of FIG. 2.
FIG. 2.

Dark current measurement of a photodetector. Inset: same graph at semilog scale.

Image of FIG. 3.
FIG. 3.

Spectral responsivity measurements of a photodetector. Inset: Normalized responsivity at bias voltage. (Responsivity at is taken as unity.)

Image of FIG. 4.
FIG. 4.

Spectral noise measurement of a high-leakage photodetector with a varying applied bias voltage.

Loading

Article metrics loading...

/content/aip/journal/apl/88/12/10.1063/1.2186974
2006-03-21
2014-04-21
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Deep-ultraviolet Al0.75Ga0.25N photodiodes with low cutoff wavelength
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/12/10.1063/1.2186974
10.1063/1.2186974
SEARCH_EXPAND_ITEM