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Light output vs current curves for fundamental and SH signals for a wide and long device. The solid lines show fundamental and SH single facet emissions, and the dashed line shows the SH surface emission data. All measurements were done at a heat-sink temperature of under pulsed bias (, ). The inset shows the external SH power conversion efficiency for facet emission. A linear fit to the data has a slope of .
High-resolution emission spectra from a wide and long device, operated at a bias of . The top curve shows single-mode SH emission and has been recorded with an InSb detector fitted with an additional thick sapphire window and a FTIR spectrometer in rapid-scan mode. The bottom curve shows the fundamental signal. Both spectra are taken from the laser facet with a nominal resolution of .
Nonlinear (top) and fundamental (bottom) light output vs drive current plots for varying heat-sink temperatures as marked on the right-hand side of the respective curves. For clarity the SH data for are multiplied by a factor of 10. The upper inset shows the wave-number shift of the SH single-mode emission as a function of heat-sink temperature. A linear fit to the data yields a tuning coefficient of . The lower inset is a schematic of a QC laser chip, the surface grating, and the resulting facet and surface emissions. The low- and high-frequency waves symbolize the fundamental and SH emissions, respectively.
Surface emission light intensity as a function of position along the longitudinal ridge direction at a distance of away from the laser chip (laser ridge ). The size of the InSb detector element is . The detector was mounted on a linear translational stage and the surface emission light was measured without collimating optics. The zero position corresponds to the center of the laser ridge.
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