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Correlation between grain and grain-boundary critical current densities in ex situ coated conductors with variable layer thickness
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10.1063/1.2188044
/content/aip/journal/apl/88/12/10.1063/1.2188044
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/12/10.1063/1.2188044
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Reverse branches of several minor hysteresis loops measured at for two RABiTS samples of different thickness, (circles) and (triangles), for maximum applied fields of , 600, 800, 1000, . The saturated peak position for each sample is indicated by arrows.

Image of FIG. 2.
FIG. 2.

Average magnetic grain size determined for several RABiTS coated conductors grown by ex situ conversion of based precursors with different thickness.

Image of FIG. 3.
FIG. 3.

Thickness dependence of and determined for several RABiTS coated conductors at by magnetic measurements and the correspondent transport critical current density . Also shown are the values of two thin films grown on single crystals with the same buffer architecture as the RABiTS CCs . Dashed lines are power law fits with an exponent .

Image of FIG. 4.
FIG. 4.

as a function of obtained at for several samples grown by ex situ precursors on RABiTS substrates of similar texture, . Different symbols correspond to samples grown by an excess of liquid formation and samples grown by an optimized process . Dashed lines are linear fits to both sets of data with slope and , respectively.

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/content/aip/journal/apl/88/12/10.1063/1.2188044
2006-03-20
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Correlation between grain and grain-boundary critical current densities in ex situ coated conductors with variable YBa2Cu3O7−δ layer thickness
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/12/10.1063/1.2188044
10.1063/1.2188044
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