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(Color online) (a) Schematic drawing of subwavelength hole array structure in metal- double-layer film on silica substrate, where the metal may be either Ag or Au. (b) Scanning near-field optical microscope (SNOM) image of the –silica hole array of diameter and pitch in the high-temperature phase of middle layer. The brightness in color stands for a stronger intensity in the far-field collection optics. (c) Schematic of the experimental setup used for optical transmission measurements.
(Color online) (a) Zeroth-order transmission of –-silica hole array with a diameter of and a lattice constant of . The solid line was obtained in the metallic phase of middle layer, while the dotted line was acquired in the semiconducting phase. (b) Transmission of –silica sample; the solid and dashed lines have the same meaning as in (a). (c) The real part of the dielectric functions of in the visible range. The inset represents the imaginary part of the dielectric functions. (d) Transmission spectra for 2° tilted incident angle in the high- and low-temperature states of a –silica hole array: the Rayleigh wavelengths for grazing orders should become longer for angles on one side of the sample and shorter for angles on the other side with increasing incident angle. The sharp minimum at splits into one occurring at and the other at .
(Color online) (Top line) Transmission hysteresis curves as a function of temperature at obtained from the double-layer hole array (a) and a smooth thick film on silica (b). (Bottom line) Results of simulations for zeroth-order transmission for (c) –silica and (d) –structures.
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