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Phase transformation and electric field tunable pyroelectric behavior of and antiferroelectric thin films
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10.1063/1.2191413
/content/aip/journal/apl/88/13/10.1063/1.2191413
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/13/10.1063/1.2191413
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Dielectric constant of the PNZST film as a function of temperature under various dc bias voltages (measured at ). The inset shows the hysteresis loop measured at .

Image of FIG. 2.
FIG. 2.

Pyroelectric coefficient of the PNZST film as a function of temperature under various dc bias voltages.

Image of FIG. 3.
FIG. 3.

hysteresis loops of the PLZST film measured at 25 and , respectively.

Image of FIG. 4.
FIG. 4.

Pyroelectric coefficient of the PLZST film as a function of temperature under various dc bias voltages.

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/content/aip/journal/apl/88/13/10.1063/1.2191413
2006-03-31
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Phase transformation and electric field tunable pyroelectric behavior of Pb(Nb,Zr,Sn,Ti)O3 and (Pb,La)(Zr,Sn,Ti)O3 antiferroelectric thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/13/10.1063/1.2191413
10.1063/1.2191413
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