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Thickness dependence of structural and piezoelectric properties of epitaxial films on Si and substrates
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10.1063/1.2185614
/content/aip/journal/apl/88/14/10.1063/1.2185614
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/14/10.1063/1.2185614
/content/aip/journal/apl/88/14/10.1063/1.2185614
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/content/aip/journal/apl/88/14/10.1063/1.2185614
2006-04-07
2014-07-31
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Thickness dependence of structural and piezoelectric properties of epitaxial Pb(Zr0.52Ti0.48)O3 films on Si and SrTiO3 substrates
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/14/10.1063/1.2185614
10.1063/1.2185614
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