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Intrinsic nonlinearity probed by intermodulation distortion microwave measurements on high quality thin films
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10.1063/1.2193053
/content/aip/journal/apl/88/14/10.1063/1.2193053
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/14/10.1063/1.2193053
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Variation of the surface resistance as a function of the applied microwave field at different temperatures. Arrows set the limit of the quadratic regime.

Image of FIG. 2.
FIG. 2.

The normalized output power of the IMD products as a function of the circulating power for the thin film under test (▵); an epitaxial Nb thin film (◻); standard high quality YBCO films (●, 엯) at the same reduced temperature . The continuous line illustrates slope 3.

Image of FIG. 3.
FIG. 3.

The behavior of vs the reduced temperature . The dotted line represents the theoretical behavior for the -wave case, the solid line for the -wave one-band case, and the dash-dotted line for the -wave two-band case with ; points represent the experimental results for standard high quality YBCO films (●, 엯); an epitaxial Nb thin film (◻); the thin film under test (▵) at a circulating power of .

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/content/aip/journal/apl/88/14/10.1063/1.2193053
2006-04-06
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Intrinsic nonlinearity probed by intermodulation distortion microwave measurements on high quality MgB2 thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/14/10.1063/1.2193053
10.1063/1.2193053
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