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Electric-field-induced resistance switching universally observed in transition-metal-oxide thin films
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10.1063/1.2193328
/content/aip/journal/apl/88/14/10.1063/1.2193328
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/14/10.1063/1.2193328

Figures

Image of FIG. 1.
FIG. 1.

X-ray diffraction pattern ( scan) for each sample. Triangles show the peaks from thin films. Other peaks are from substrate.

Image of FIG. 2.
FIG. 2.

Resistance values of each sample as a function of the number of applied pulses. The polarity of the electric pulses is changed every five pulses, except for (.) Open circles correspond to the resistance after a positive electric pulse (a positive voltage on the Au electrode) is applied, whereas closed circles to the one after a negative pulse (a positive voltage on the Al electrode) is applied.

Image of FIG. 3.
FIG. 3.

curves of (a) , (b) , and (c) . The upper panel shows a schematic picture of the electrodes on the thin film.

Image of FIG. 4.
FIG. 4.

(Color online) Resistance between two out of three (Au, Al, and the third) electrodes for and as a function of the number of applied pulses. Electric pulses are applied between the Au and Al electrodes, and the polarity of the electric pulses is changed every five pulses.

Tables

Generic image for table
Table I.

The crystal structure, the orbital character of carriers, the substrate temperature and the oxygen pressure during deposition, and a reference for each sample.

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/content/aip/journal/apl/88/14/10.1063/1.2193328
2006-04-06
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electric-field-induced resistance switching universally observed in transition-metal-oxide thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/14/10.1063/1.2193328
10.1063/1.2193328
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