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Experimentally determined spin polarization vs interface parameter for various samples. (a) NiMnSb bulk (∎), polycrystalline film grown by PLD on Si (●), M659 (◻), M789 (엯), and scanned data from Ritchie et al. (Ref. 15) (▵). (b) (∎), (●), film with thickness of (▴), and film with thickness of (★) are all grown on sapphire (110). grown on GaAs (001) (˟). bulk (◻), bulk (엯), and bulk (▵). The error bars indicate the respective lower/upper bound for and , respectively, acquired from the fitting procedure.
The apparent simulated by the two channel model is shown by solid lines. The shaded regions indicate distributions of experimental data. The insets are as a function of for two experimental data sets (same symbols as in Fig. 1) and generated spectra (solid lines).
Examples of generated (open circles) and experimental (solid lines) spectra with similar values of fitted parameters are shown for comparison. (a) The spectrum is generated using with an experimental spectrum with fit parameters . The generated spectrum is fitted by (1.45, 0.4, 0.41, 0.71) and it is compared with the experimental spectrum with (1.44, 0.4, 0.401, 0.55). (b) The spectrum is generated using with an experimental spectrum with fit parameters (1.4, 0.45, 0.31, 1.07). The generated spectrum is fitted by (1.2, 0.49, 0.2, 1.07) and it is compared with the experimental spectrum with (1.47, 0.51, 0.19, 0.89).
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