1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Low-frequency voltage noise and electrical transport in [100]-tilt grain-boundary junctions
Rent:
Rent this article for
USD
10.1063/1.2193307
/content/aip/journal/apl/88/15/10.1063/1.2193307
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/15/10.1063/1.2193307

Figures

Image of FIG. 1.
FIG. 1.

Current-voltage characteristics of a -wide [100]-tilt grain-boundary junction at temperatures from 7 to . Inset (left): characteristic voltage vs temperature. Inset (right): atomic force microscopy image of unpatterned [100]-tilt grain boundary.

Image of FIG. 2.
FIG. 2.

Voltage noise as a function of frequency for -wide [100]-tilt grain-boundary junction at temperatures from 7 to . Junction voltages were set equal to the characteristic voltages for each temperature.

Image of FIG. 3.
FIG. 3.

Voltage noise at a frequency of vs square of the dc voltage for [100]-tilt grain-boundary junction at temperatures ranging from 45 to . Dashed lines are the fitting curves according to Eq. (1).

Tables

Generic image for table
Table I.

Summary of noise data for [100]-tilt bicrystal junctions at temperature .

Loading

Article metrics loading...

/content/aip/journal/apl/88/15/10.1063/1.2193307
2006-04-11
2014-04-21
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Low-frequency voltage noise and electrical transport in [100]-tilt YBa2Cu3O7−x grain-boundary junctions
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/15/10.1063/1.2193307
10.1063/1.2193307
SEARCH_EXPAND_ITEM