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(Color online) (a) Schematics of bowtie aperture (top) and bowtie antenna (bottom). The gray areas represent metal film. (b) SEM image of bowtie aperture and comparable regular apertures fabricated in aluminum on quartz substrate.
(Color online) (a) Schematic of the homebuilt near-field scanning optical microscopy (NSOM) system using the cantilevered silicon nitride aperture probe. (b) Top view and (c) side view of the NSOM probe. The insets show that the probe has a flat end of in size with a silicon nitride core surrounded by aluminum.
(Color online) (a) NSOM image of the aperture array shown in Fig. 1(b) taken with a incident laser polarized in the direction. The near-field optical profiles of these apertures are displayed in line scans along (b) line 1 and line 2 and (c) line 3 and line 4. The FWHM of the light spots and the edge resolution of the probe is indicated in the plots.
(Color online) Electric field intensity distribution (a) in the plane cut through the middle of the tips and (b) in the plane across the exit plane of the bowtie aperture obtained by FDTD calculation.
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