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Mapping the local nanostructure inside a specimen by tomographic small-angle x-ray scattering
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10.1063/1.2196062
/content/aip/journal/apl/88/16/10.1063/1.2196062
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/16/10.1063/1.2196062
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Side view of the setup for micro-small-angle scattering tomography. (b) Top view of the sample region.

Image of FIG. 2.
FIG. 2.

(Color online) Small-angle x-ray scattering patterns of an injection-molded polyethylene rod (cylinder axis parallel to ) recorded with an x-ray microbeam impinging (a) peripherally and (b) centrally. The intensity scale is logarithmic.

Image of FIG. 3.
FIG. 3.

Reconstructed attenuation coefficient and integral scattered intensity along the axis as a function of and on a virtual section through the sample. The diffraction patterns reconstructed at the locations marked in the right image are shown in Fig. 4.

Image of FIG. 4.
FIG. 4.

(Color online) Reconstructed SAXS cross section along the direction [, left] and 2D sections through reciprocal space [, right] at different locations in the tomographic reconstruction shown in Fig. 3. The arrows indicate the period of the lamellar structure.

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/content/aip/journal/apl/88/16/10.1063/1.2196062
2006-04-18
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Mapping the local nanostructure inside a specimen by tomographic small-angle x-ray scattering
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/16/10.1063/1.2196062
10.1063/1.2196062
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