banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Metastability of and its implications on thin-film growth
Rent this article for
View: Figures


Image of FIG. 1.
FIG. 1.

Crystal structures of the chalcopyrite (left, subscript “ch”) and CuAu-type (right, subscript “CA”) phase of CIS. For the CuAu-type structure a conventional unit cell is shown, which is used throughout this work for indexing CuAu-type reflections and evaluation of the lattice parameters. The tetragonal primitive unit cell for the CuAu-type structure differs from the depicted unit cell by a rotation of 45° in the plane and by being half as large (Ref. 16).

Image of FIG. 2.
FIG. 2.

RBS spectrum of an epitaxial CIS thin film on Si(001). The contributions of the individual elements to the spectrum are indicated. The inset shows the normalized height distribution of the sample as derived from the RBS spectrum. The spectrum was recorded with an incident energy of .

Image of FIG. 3.
FIG. 3.

XRD spectra of the in-plane reflections. Mixed Lorentz/Gauss profiles (solid lines) were fitted to the spectra. The high diffraction intensity around is due to the Si substrate.

Image of FIG. 4.
FIG. 4.

XRD spectra of the out-of-plane reflections as measured in transmission geometry.


Article metrics loading...


Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Metastability of CuInS2 and its implications on thin-film growth