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Crystal structures of the chalcopyrite (left, subscript “ch”) and CuAu-type (right, subscript “CA”) phase of CIS. For the CuAu-type structure a conventional unit cell is shown, which is used throughout this work for indexing CuAu-type reflections and evaluation of the lattice parameters. The tetragonal primitive unit cell for the CuAu-type structure differs from the depicted unit cell by a rotation of 45° in the plane and by being half as large (Ref. 16).
RBS spectrum of an epitaxial CIS thin film on Si(001). The contributions of the individual elements to the spectrum are indicated. The inset shows the normalized height distribution of the sample as derived from the RBS spectrum. The spectrum was recorded with an incident energy of .
XRD spectra of the in-plane reflections. Mixed Lorentz/Gauss profiles (solid lines) were fitted to the spectra. The high diffraction intensity around is due to the Si substrate.
XRD spectra of the out-of-plane reflections as measured in transmission geometry.
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