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(Color online) (a) In-plane dielectric constant and (b) as a function of temperature of a thick coherently strained film. The data from Ref. 15 of a strained film grown under similar conditions are included in the plots.
(Color online) Vogel-Fulcher fit to the data in Fig. 1(b).
(Color online) (a) Hysteresis loops measured at room temperature (●) and in liquid nitrogen at (◇) on the same film as Fig. 1. The large slope is due to uncorrected parasitic capacitance. (b) Remanent polarization (●) and coercive voltage (◇) measured as a function of temperature on the same film as Fig. 1. [ and ]. (Note: the and not going to zero is an indication of loss in the sample.)
(Color online) SIMS analysis on the same film as Fig. 1 showing diffusion of Sc and Dy from the substrate into the film. The regions of the film, interface, and substrate are labeled on the graph and the region of the interface is highlighted.
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