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Toward spectroscopy: Analytic solution of the three-phase model of polarimetry in the thin-film limit
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10.1063/1.2203967
/content/aip/journal/apl/88/20/10.1063/1.2203967
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/20/10.1063/1.2203967
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Figures

Image of FIG. 1.
FIG. 1.

(Color online) First-order and extended simulations for on Si, as described in the text.

Image of FIG. 2.
FIG. 2.

(Color online) Data for reversibly physisorbed on oxidized GaAs measured at with a rotating-compensator spectroscopic ellipsometer operating in a polarimetric mode.

Image of FIG. 3.
FIG. 3.

(Color online) layer properties from the data of Fig. 2.

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/content/aip/journal/apl/88/20/10.1063/1.2203967
2006-05-15
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Toward nκd spectroscopy: Analytic solution of the three-phase model of polarimetry in the thin-film limit
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/20/10.1063/1.2203967
10.1063/1.2203967
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