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(a) Horizontal line profile of RHEED patterns comprising Si and Sr streaks. (b) Sequential horizontal line profile of RHEED patterns and their fitting profiles (solid and gray lines, respectively) for Sr and Si streaks in the thickness range of 1.0–2.0. (c) In-plane lattice constants of Sr film and Si surface. The orientation of incident electron beam is parallel to the azimuth of Si(111) substrate.
(a) Integrated intensity of streaks from Sr film. (b) Grain size at Si surface and Sr film. The orientation of incident electron beam is parallel to the azimuth of Si(111) substrate.
Schematic atomic structure of interface. Left, view of Sr(111) on a Si surface terminated by hydrogen atoms along the direction. Right, view of the interface with the initial one atomic layer of Sr.
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