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(Color online) AFM image of the surface morphology of Ge on (a) planar Si and (b) 2D nanostructured Si and (c) cross-section SEM image of Ge on nanostructured Si substrate and (d) composition scan (EDAX) of structure showing three points.
Cross-section TEM images (composite) of Ge on (a) 2D nanostructured Si and (b) unpatterned Si showing different regions of the sample from the substrate (top) to the film (bottom).
(Color online) Symetrical (004) reciprocal space maps (RSMs) of Ge on (a) planar Si and (b) 2D nanostructured Si substrate.
(Color online) The Nomarski optical images of the etched surfaces of Ge on (a) planar Si substrate and (b) nanostructured Si substrate.
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