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Real time spectroscopic ellipsometry of nanoparticle growth
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10.1063/1.2206870
/content/aip/journal/apl/88/21/10.1063/1.2206870
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/21/10.1063/1.2206870
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Figures

Image of FIG. 1.
FIG. 1.

(a) TEM image of a silver nanoparticle embedded in polystyrene matrix. The particle is an approximately spherical single crystal of radius ; (b) SEM image of exposed nanoparticles following the complete evaporation of the polymer matrix. (c) Particle sizes measured from the SEM image.

Image of FIG. 2.
FIG. 2.

(a) Measured ellipsometric parameters and (open circles) at and generated fits (solid lines) from the Maxwell-Garnett EMA using a Drude model for silver with modified electron relaxation frequency: (b) Generated dielectric constants for the composite film showing the plasmon polariton absorption at .

Image of FIG. 3.
FIG. 3.

(a) Film thickness and silver content of the composite film during heating: (b) Inverse of the relaxation frequency and nanoparticle radius calculated by scaling the relaxation frequency with the final value of particle radius determined from microscopy. For particles smaller than the model is unable to predict the radius due to quantum size effects.

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/content/aip/journal/apl/88/21/10.1063/1.2206870
2006-05-25
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Real time spectroscopic ellipsometry of nanoparticle growth
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/21/10.1063/1.2206870
10.1063/1.2206870
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