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Distribution of the constituent elements along the depth direction obtained from EDAX linescan for sample C. Inset shows a cross section SEM image of sample C.
Typical x-ray diffraction pattern of the samples. Inset shows the predominant (400) reflection from an InSb film and the samples.
Fourier transform infrared transmission spectra at room temperature of the films. Inset shows the corresponding for linear fitting.
Spectral responsivity of the photoconductors fabricated on samples A and C at (a) and (b) room temperature.
Growth temperatures , compositions obtained from EDAX and XRD, results of the Hall measurements at RT, and band gaps obtained from the FTIR data for the films. denotes band gaps at calculated from the equation of Woolley and Warner.
Maximum responsivities and cutoff photon energies obtained from the responsivity spectra of the photoconductors.
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