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(a) HRXRD pattern of the thin film around the 0004 Bragg diffraction of ZnO and (b) surface morphology of the thin film measured with AFM.
PL spectra excited by monochromatic light of the ZnO and thin films in the energy region of a so-called broadband at , where the excitation energies of monochromatic light are for the ZnO film and for the ZnMnO film. The inset shows the PL spectra excited by the He–Cd laser in the energy region of the band-edge exciton of ZnO.
Decay profiles of the broad PL bands detected at 2.067 and in the ZnO thin film (a) and the thin film (b), where the excitation-light pulse is the dye laser with the energy of .
PLE spectra of the ZnO and thin films detected at the energies of the bound exciton and the broadband.
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