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X-ray diffraction patterns for (a) the initial porous Si and (b) oxidized porous Si.
IR transmission spectra for the initial porous Si (solid line) and the oxidized porous Si (dashed line).
Transmission spectrum for OPS sample placed between two orthogonal polarizers normalized to the one taken for the same sample but for parallel orientation of polarizers.
Polarizational dependences of the TH signal for OPS: Open circles represent experimental measurements for the polarization of the TH signal parallel to ; filled squares represent experimental measurements for the polarization of the TH signal parallel to . Dashed and solid lines represent the theoretical fits using Eq. (5) for the above directions, respectively.
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