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Form birefringence of oxidized porous silicon
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10.1063/1.2212534
/content/aip/journal/apl/88/24/10.1063/1.2212534
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/24/10.1063/1.2212534
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

X-ray diffraction patterns for (a) the initial porous Si and (b) oxidized porous Si.

Image of FIG. 2.
FIG. 2.

IR transmission spectra for the initial porous Si (solid line) and the oxidized porous Si (dashed line).

Image of FIG. 3.
FIG. 3.

Transmission spectrum for OPS sample placed between two orthogonal polarizers normalized to the one taken for the same sample but for parallel orientation of polarizers.

Image of FIG. 4.
FIG. 4.

Polarizational dependences of the TH signal for OPS: Open circles represent experimental measurements for the polarization of the TH signal parallel to ; filled squares represent experimental measurements for the polarization of the TH signal parallel to [001]. Dashed and solid lines represent the theoretical fits using Eq. (5) for the above directions, respectively.

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/content/aip/journal/apl/88/24/10.1063/1.2212534
2006-06-15
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Form birefringence of oxidized porous silicon
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/24/10.1063/1.2212534
10.1063/1.2212534
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