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(Color online) Selected area electron diffraction patterns of (a) pure polycrystalline layer and (b) amorphous composite films. AFM images of (c) pure layer (d) composite films. The value of rms roughness is for pure layer and for the composite layer.
(Color online) Plots of and high-frequency characteristics (inset) measured from the Au/dielectrics/ITO structure.
(Color online) Field effect transistor characteristics of our pentacene TFTs: curves at various obtained from TFTs with (a) HMDS-treated dielectric layer and with (c) HMDS-treated dielectric layers; and curves for the estimation of saturation regime mobility that were obtained at from TFTs with (b) HMDS-treated pure dielectric layer and with (d) HMDS-treated dielectric layers (channel length and channel width ).
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