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Electrical characterization of defects introduced during electron beam deposition of Pd Schottky contacts on -type Ge
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10.1063/1.2213203
/content/aip/journal/apl/88/24/10.1063/1.2213203
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/24/10.1063/1.2213203
/content/aip/journal/apl/88/24/10.1063/1.2213203
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/content/aip/journal/apl/88/24/10.1063/1.2213203
2006-06-14
2014-07-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electrical characterization of defects introduced during electron beam deposition of Pd Schottky contacts on n-type Ge
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/24/10.1063/1.2213203
10.1063/1.2213203
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