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Graphoepitaxy of sexithiophene on thermally oxidized silicon surface with artificial periodic grooves
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10.1063/1.2216375
/content/aip/journal/apl/88/25/10.1063/1.2216375
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/25/10.1063/1.2216375
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Topography and three-dimensional view of artificial grooves area) observed using AFM.

Image of FIG. 2.
FIG. 2.

(a) Out-of-plane XRD pattern ( scan) of film grown on microfabricated substrate. The inset shows the rocking curve for (12,00) reflection (x-ray beam ‖ grooves). (b) GIXD patterns ( scan) where scattering vector is parallel or perpendicular to groove direction. Profile for is shifted by upward for convenience. (c) GIXD pattern of scan showing azimuthal distribution of (020) reflection of 6T. Angles and 180° correspond to condition and are for case. The left inset schematically shows in-plane orientation of graphoepitaxial component.

Image of FIG. 3.
FIG. 3.

Statistical analysis of grain orientation using AFM images. [(a) and (b)] AFM topography of 6T films grown on artificial grooves. The arrows show direction of axis of each 6T grain. (c) Possible grain shapes of 6T assuming grains are predominantly {010}, {001}, and {011} faceted. (d) Histogram (no. of grains) showing azimuthal distribution of axis of 6T grains (0° corresponds to ; 90° for ⊥ grooves).

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/content/aip/journal/apl/88/25/10.1063/1.2216375
2006-06-19
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Graphoepitaxy of sexithiophene on thermally oxidized silicon surface with artificial periodic grooves
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/25/10.1063/1.2216375
10.1063/1.2216375
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