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Surface scanning probe microscopy investigation of solution deposited thin films
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10.1063/1.2212280
/content/aip/journal/apl/88/26/10.1063/1.2212280
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/26/10.1063/1.2212280
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Grazing incidence XRD patterns of BFO thin films. The upper patterns are for the fine grained film. The perovskite peaks are indexed according to a pseudocubic lattice geometry.

Image of FIG. 2.
FIG. 2.

(Color online) AFM micrographs showing the surface topography and grain morphology of the (a) large grained and (b) fine grained films.

Image of FIG. 3.
FIG. 3.

Frequency dependence of the dielectric constant and the loss tangent of the film microstructures investigated. SG designates small grains, whereas LG designates large grains.

Image of FIG. 4.
FIG. 4.

Polarization hysteresis loops of the BFO microstructures investigated.

Image of FIG. 5.
FIG. 5.

(Color online) Scanning surface potential force microscopy of the film microstructures investigated. The micrographs correspond to the topographies shown in Fig. 2. The areas numbered 1, 2, and 3 correspond to those in Fig. 2.

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/content/aip/journal/apl/88/26/10.1063/1.2212280
2006-06-27
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Surface scanning probe microscopy investigation of solution deposited BiFeO3 thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/26/10.1063/1.2212280
10.1063/1.2212280
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