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Grazing incidence XRD patterns of BFO thin films. The upper patterns are for the fine grained film. The perovskite peaks are indexed according to a pseudocubic lattice geometry.
(Color online) AFM micrographs showing the surface topography and grain morphology of the (a) large grained and (b) fine grained films.
Frequency dependence of the dielectric constant and the loss tangent of the film microstructures investigated. SG designates small grains, whereas LG designates large grains.
Polarization hysteresis loops of the BFO microstructures investigated.
(Color online) Scanning surface potential force microscopy of the film microstructures investigated. The micrographs correspond to the topographies shown in Fig. 2. The areas numbered 1, 2, and 3 correspond to those in Fig. 2.
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