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Variation of reflectivity with temperature of the as-deposited films.
Relationship among reflectivity, contrast, and laser beam wavelength of the as-deposited, (a) 300 and (b) annealed films.
X-ray diffraction patterns of various as-deposited films.
TEM bright field image and diffraction pattern of the (a) as-deposited, (b) 300 and (c) annealed films.
Relationship between the writing power and carrier-to-noise ratio (CNR) of the film.
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